米兰官方网页版-米兰MiLan(中国)

    1. Silicon wafer AOI equipment

      Product Introduction

      Bright-field and dark-field wafer surface inspection using high-resolution imaging  based on three modes: image algorithm, detection model and anomaly detection, and provides statistical analysis.

      2D Inspection accuracy
      um

      1

      UPH
      pcs/h

      60

      Escape
      ppm

      ≤50

      米兰官方网页版-米兰MiLan(中国)

      米兰官方网页版-米兰MiLan(中国)